In partnership with

would like to invite you to attend our upcoming: 

RF DEVICE CHARACTERIZATION MEASUREMENTS AND MODELLING SEMINAR

October 4, Oulu, Finland

During this day we address challenges in RF transistor, circuit, and system design. Topics such as:

– How can I improve accuracy and speed of my modeling?

– How can I generate reliable data for my 5G/6G models? (Including wideband modulation, large signal, and harmonics.)

– How to address the thermal challenges in GaN devices?

– Increase the efficiency of my measurement bench and engineering resources?

– How do you link circuit, sub-system, and system modelling in an efficient way?

– How can I simulate wideband modulated signals reliable enough to replace costly measurement tasks of large system architectures?

The seminar is of interest to members of the RF-community that are involved in measurement and/or modelling of RF Transistors, Amplifiers, IC’s, Circuits, or Systems.

Seminar date:

4 October 2022 | 8:30 – 16:30

Seminar Venue:

Nokia Oyj, Kaapelitie 4, 90620 Oulu

Seminar Agenda:  

Seminar Format:

Lunch and refreshments will be provided. Registration opens at 8:30 for a 9:00 start and will close at 16:30.

On October 5, there is a possibility to schedule a dedicated, face-to-face, meeting with the presenters.

Presenters:

Represented Companies:

Registration:

REGISTRATION HAS CLOSED. If you still wish to participate, please sent an email to chris.caenen@hitechbv.nl.