HITECH represent the following Test & Measurement solutions:


  • Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.


  • Kaelustest and measurement products are used in design, manufacturing and RF wireless solutions. Their Test and Measurement portfolio includes cable and antenna analyzers and PIM test equipment.


Would you like to try our solutions yourself? Please contact us to discuss your test & measurement requirements in more detail.

Maury Microwave